{"product_id":"thin-film-analysis-by-x-ray-scattering","title":"Thin Film Analysis by X-Ray Scattering","description":"With contributions by Paul F. Fewster and Christoph Genzel    While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.","brand":"EMKA","offers":[{"title":"Default Title","offer_id":53451679498571,"sku":"9783527310524","price":202.8,"currency_code":"EUR","in_stock":true}],"url":"https:\/\/emka.si\/products\/thin-film-analysis-by-x-ray-scattering","provider":"EMKA","version":"1.0","type":"link"}