318 rezultatov
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Thin Film Analysis by X-Ray Scattering(2005) BIRKHOLZ, MARIO (IHP MICROELECTRONICS, FRANKFURT/ODER, GERMANY)With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st cVezava: Trda202,80 € -
Svetloba iz vesolja = The Light from Space(2025) FRANC ROZMANSlovenski, angleški jezikVezava: Mehka10,00 € -
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Introduction to Fluid Dynamics in Physics and Astrophysics(2024) HENDRIK JAN VAN EERTENVezava: Mehka81,63 €










